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1

Burden of pulmonary tuberculosis in modern prison: A cross sectional prevalence survey from south India

Dolla, Chandra Kumar, Dhanraj, Baskaran, Malaisamy, Muniyandi, Padma Priyadarshini, C., Syeed Hissar, S., Natrajan, Mohan, Krishnan, Rajendran, Tripathy, Srikanth Prasad

Journal:

Indian Journal of Tuberculosis

Year:

2018

Language:

english

File:

PDF, 221 KB

english, 2018

2

[IEEE 2009 IEEE Custom Integrated Circuits Conference (CICC) - San Jose, CA, USA (2009.09.13-2009.09.16)] 2009 IEEE Custom Integrated Circuits Conference - Circuit aging prediction for low-power operation

Zheng, Rui, Velamala, Jyothi, Reddy, Vijay, Balakrishnan, Varsha, Mintarno, Evelyn, Mitra, Subhasish, Krishnan, Srikanth, Cao, Yu

Year:

2009

Language:

english

File:

PDF, 614 KB

english, 2009

3

Characterization of dielectric properties and conductivity in encapsulation materials with high insulating filler contents

Cornigli, Davide, Reggiani, Susanna, Gnudi, Antonio, Gnani, Elena, Baccarani, Giorgio, Fabiani, Davide, Varghese, Dhanoop, Tuncer, Enis, Krishnan, Srikanth, Nguyen, Luu

Journal:

IEEE Transactions on Dielectrics and Electrical Insulation

Year:

2018

Language:

english

File:

PDF, 2.24 MB

english, 2018

4

Impact of negative bias temperature instability on digital circuit reliability

Vijay Reddy, Anand T. Krishnan, Andrew Marshall, John Rodriguez, Sreedhar Natarajan, Tim Rost, Srikanth Krishnan

Journal:

Microelectronics Reliability

Year:

2005

Language:

english

File:

PDF, 356 KB

english, 2005

5

Atomic-Scale Defects Involved in the Negative-Bias Temperature Instability

Campbell, Jason P., Lenahan, Patrick M., Cochrane, Corey J., Krishnan, Anand T., Krishnan, Srikanth

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2007

Language:

english

File:

PDF, 639 KB

english, 2007

6

[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - Scaling reliability and modeling of ferroelectric capacitors

Acosta, Antonio G., Rodriguez, John, Obradovic, Borna, Summerfelt, Scott, San, Tamer, Green, Keith, Moise, Ted, Krishnan, Srikanth

Year:

2010

Language:

english

File:

PDF, 495 KB

english, 2010

7

The origin of broad distribution of breakdown times in polycrystalline thin film dielectrics

Masuduzzaman, Muhammad, Xie, Sujing, Chung, Jayhoon, Varghese, Dhanoop, Rodriguez, John, Krishnan, Srikanth, Ashraful Alam, Muhammad

Journal:

Applied Physics Letters

Year:

2012

Language:

english

File:

PDF, 1.13 MB

english, 2012

8

Negative bias temperature instability mechanism: The role of molecular hydrogen

Krishnan, Anand T., Chakravarthi, Srinivasan, Nicollian, Paul, Reddy, Vijay, Krishnan, Srikanth

Journal:

Applied Physics Letters

Year:

2006

Language:

english

File:

PDF, 250 KB

english, 2006

9

A Model for NBTI in Nitrided Oxide MOSFETs Which Does Not Involve Hydrogen or Diffusion

Lenahan, Patrick M., Campbell, Jason P., Krishnan, Anand T., Krishnan, Srikanth

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2011

Language:

english

File:

PDF, 340 KB

english, 2011

10

[IEEE ICASSP 2015 - 2015 IEEE International Conference on Acoustics, Speech and Signal Processing (ICASSP) - South Brisbane, Queensland, Australia (2015.4.19-2015.4.24)] 2015 IEEE International Conference on Acoustics, Speech and Signal Processing (ICASSP) - Low bit rate high-quality MDCT audio coding of the 3GPP EVS standard

Nagisetty, Srikanth, Liu, Zongxian, Kawashima, Takuya, Ehara, Hiroyuki, Zhou, Xuan, Wang, Bin, Liu, Zexin, Miao, Lei, Gibbs, Jon, Laaksonen, Lasse, Atti, Venkatraman, Rajendran, Vivek, Krishnan, Venka

Year:

2015

Language:

english

File:

PDF, 573 KB

english, 2015

11

Neurosurgical referral service using smartphone client WhatsApp: preliminary study at a tertiary referral neurosurgical unit

Joshi, Shashank S., Murali-Krishnan, Srikanth, Patankar, Prasanna, Choudhari, Kishor A.

Journal:

British Journal of Neurosurgery

Year:

2018

Language:

english

File:

PDF, 901 KB

english, 2018

12

Effects of Filler Configuration and Moisture on Dissipation Factor and Critical Electric Field of Epoxy Composites for HV-ICs Encapsulation

Ahn, Woojin, Cornigli, Davide, Varghese, Dhanoop, Nguyen, Luu, Krishnan, Srikanth, Reggiani, Susanna, Alam, Muhammad Ashraful

Journal:

IEEE Transactions on Components Packaging and Manufacturing Technology

Year:

2020

File:

PDF, 1.09 MB

2020

13

Distributed MAC protocols and priority oriented scheduling for a PLC access network

S. Sundaresan, S. Anand, S. Srikanth, C. N. Krishnan

Journal:

International Journal of Communication Systems

Year:

2003

Language:

english

File:

PDF, 208 KB

english, 2003

14

Towards a logical reconstruction of structured modeling

Srikanth Chari, Ramayya Krishnan

Journal:

Decision Support Systems

Year:

1993

Language:

english

File:

PDF, 1.35 MB

english, 1993

15

High-dose oxygen ion implanted heterointerfaces in silicon

S. Ashok, Srikanth Krishnan

Journal:

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Year:

1995

Language:

english

File:

PDF, 677 KB

english, 1995

16

Three-dimensional surface displacements and rotations from differencing pre- and post-earthquake LiDAR point clouds

Nissen, Edwin, Krishnan, Aravindhan K., Arrowsmith, J. Ramón, Saripalli, Srikanth

Journal:

Geophysical Research Letters

Year:

2012

Language:

english

File:

PDF, 1.43 MB

english, 2012

17

[IEEE 2011 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2011.04.10-2011.04.14)] 2011 International Reliability Physics Symposium - A TDC-based test platform for dynamic circuit aging characterization

Chen, Min, Reddy, Vijay, Carulli, John, Krishnan, Srikanth, Rentala, Vijay, Srinivasan, Venkatesh, Cao, Yu

Year:

2011

Language:

english

File:

PDF, 441 KB

english, 2011

18

Observation and Control of Hot Atom Damage in Ferroelectric Devices

Masuduzzaman, Muhammad, Varghese, Dhanoop, Rodriguez, John A., Krishnan, Srikanth, Alam, Muhammad Ashraful

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 2.05 MB

english, 2014

19

[IEEE 2012 IEEE International Symposium on Safety, Security, and Rescue Robotics (SSRR) - College Station, TX, USA (2012.11.5-2012.11.8)] 2012 IEEE International Symposium on Safety, Security, and Rescue Robotics (SSRR) - 3D change detection using low cost aerial imagery

Krishnan, Aravindhan K, Saripalli, Srikanth, Nissen, Edwin, Arrowsmith, Ramon

Year:

2012

Language:

english

File:

PDF, 677 KB

english, 2012

20

[IEEE 2007 IEEE Custom Integrated Circuits Conference - San Jose, CA, USA (2007.09.16-2007.09.19)] 2007 IEEE Custom Integrated Circuits Conference - An Integrated Modeling Paradigm of Circuit Reliability for 65nm CMOS Technology

Wang, Wenping, Reddy, Vijay, Krishnan, Anand T., Vattikonda, Rakesh, Krishnan, Srikanth, Cao, Yu

Year:

2007

Language:

english

File:

PDF, 713 KB

english, 2007

21

[IEEE 2010 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2010.12.6-2010.12.8)] 2010 International Electron Devices Meeting - Product drift from NBTI: Guardbanding, circuit and statistical effects

Krishnan, Anand T, Cano, Frank, Chancellor, Cathy, Reddy, Vijay, Zhangfen Qi,, Jain, Palkesh, Carulli, John, Masin, Jonathan, Zuhoski, Steve, Krishnan, Srikanth, Ondrusek, Jay

Year:

2010

Language:

english

File:

PDF, 579 KB

english, 2010

22

[IEEE 2008 IEEE Custom Integrated Circuits Conference - CICC 2008 - San Jose, CA, USA (2008.09.21-2008.09.24)] 2008 IEEE Custom Integrated Circuits Conference - Statistical prediction of circuit aging under process variations

Wang, Wenping, Reddy, Vijay, Bo Yang,, Balakrishnan, Varsha, Krishnan, Srikanth, Yu Cao,

Year:

2008

Language:

english

File:

PDF, 326 KB

english, 2008

23

A Quantitative Assessment of Charge Collection Efficiency of N+ and P+ Diffusion Areas in Terrestrial Neutron Environment

Zhu, Xiaowei, Deng, Xiaowei, Baumann, Robert, Krishnan, Srikanth

Journal:

IEEE Transactions on Nuclear Science

Year:

2007

Language:

english

File:

PDF, 859 KB

english, 2007

24

[IEEE ESSDERC 2013 - 43rd European Solid State Device Research Conference - Bucharest, Romania (2013.09.16-2013.09.20)] 2013 Proceedings of the European Solid-State Device Research Conference (ESSDERC) - ACE: A robust variability and aging sensor for high-k/metal gate SoC

Chen, Min, Reddy, Vijay, Krishnan, Srikanth, Ondrusek, Jay, Cao, Yu

Year:

2013

Language:

english

File:

PDF, 691 KB

english, 2013

25

[IEEE 2013 IEEE Second International Conference on Image Information Processing (ICIIP) - Shimla, India (2013.12.9-2013.12.11)] 2013 IEEE Second International Conference on Image Information Processing (ICIIP-2013) - Circuit recognition using netlist

Sridar, Srikanth, Subramanian, Krishnan

Year:

2013

Language:

english

File:

PDF, 535 KB

english, 2013

26

Electric Street Cars

Sridar, Srikanth, Subramanian, Krishnan

Journal:

Transactions of the American Institute of Electrical Engineers

Year:

1886

Language:

english

File:

PDF, 3.38 MB

english, 1886

27

Asymmetric Aging and Workload Sensitive Bias Temperature Instability Sensors

Chen, Min, Reddy, Vijay, Krishnan, Srikanth, Srinivasan, Venkatesh, Cao, Yu

Journal:

IEEE Design & Test of Computers

Year:

2012

Language:

english

File:

PDF, 902 KB

english, 2012

28

The origin and consequences of push-pull breakdown in series connected dielectrics

Masuduzzaman, Muhammad, Varghese, Dhanoop, Guo, Honglin, Krishnan, Srikanth, Alam, Muhammad Ashraful

Journal:

Applied Physics Letters

Year:

2011

Language:

english

File:

PDF, 767 KB

english, 2011

29

[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - On the bias dependence of time exponent in NBTI and CHC effects

Velamala, Jyothi B., Reddy, Vijay, Zheng, Rui, Krishnan, Srikanth, Cao, Yu

Year:

2010

Language:

english

File:

PDF, 265 KB

english, 2010

30

[IEEE 2006 IEEE International Reliability Physics Symposium Proceedings - San Jose, CA, USA (2006.3.26-2006.3.26)] 2006 IEEE International Reliability Physics Symposium Proceedings - 2006 Irps Tutorial Program

Krishnan, Srikanth

Year:

2006

Language:

english

File:

PDF, 438 KB

english, 2006

31

[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - New electromigration validation: Via Node Vector Method

Park, Young-Joon, Jain, Palkesh, Krishnan, Srikanth

Year:

2010

Language:

english

File:

PDF, 359 KB

english, 2010

32

[IEEE 2014 IEEE International Reliability Physics Symposium (IRPS) - Waikoloa, HI, USA (2014.6.1-2014.6.5)] 2014 IEEE International Reliability Physics Symposium - Current collapse in GaN heterojunction field effect transistors for high-voltage switching applications

Joh, Jungwoo, Tipirneni, Naveen, Pendharkar, Sameer, Krishnan, Srikanth

Year:

2014

Language:

english

File:

PDF, 406 KB

english, 2014

33

Digital mouse phantom for optical imaging

Dwivedi, Shekhar, Krishnan, Kajoli B., Suryanarayanan, Srikanth

Journal:

Journal of Biomedical Optics

Year:

2007

Language:

english

File:

PDF, 459 KB

english, 2007

34

The Role of Dielectric Heating and Effects of Ambient Humidity in the Electrical Breakdown of Polymer Dielectrics

Palit, Sambit, Varghese, Dhanoop, Guo, Honglin, Krishnan, Srikanth, Alam, Muhammad

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2015

Language:

english

File:

PDF, 1.52 MB

english, 2015

35

Coseismic fault zone deformation revealed with differential lidar: Examples from Japanese

Nissen, Edwin, Maruyama, Tadashi, Ramon Arrowsmith, J, Elliott, John R., Krishnan, Aravindhan K., Oskin, Michael E., Saripalli, Srikanth

Journal:

Earth and Planetary Science Letters

Year:

2014

Language:

english

File:

PDF, 7.45 MB

english, 2014

36

[IEEE 2013 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2013.04.14-2013.04.18)] 2013 IEEE International Reliability Physics Symposium (IRPS) - Preface

Krishnan, Srikanth

Year:

2013

Language:

english

File:

PDF, 64 KB

english, 2013

37

Carrizo: A High Performance, Energy Efficient 28 nm APU

Munger, Benjamin, Akeson, David, Arekapudi, Srikanth, Burd, Tom, Fair, Harry R., Farrell, Jim, Johnson, Dave, Krishnan, Guhan, McIntyre, Hugh, McLellan, Edward, Naffziger, Samuel, Schreiber, Russell,

Journal:

IEEE Journal of Solid-State Circuits

Year:

2016

Language:

english

File:

PDF, 3.80 MB

english, 2016

38

Chitosan supported silver nanowire as a platform for direct electrochemistry and highly sensitive electrochemical glucose biosensing

Krishnan, Siva Kumar, Chakaravarthy, Srikanth, Rangel, Adriana Hernandez, Prokhorov, Evgen, LUNA-BÁRCENAS, GABRIEL, Esparza, Rodrigo, Meyyappan, Meyya

Journal:

Year:

2016

Language:

english

File:

PDF, 1.56 MB

english, 2016

39

[IEEE 2014 IEEE/RSJ International Conference on Intelligent Robots and Systems (IROS 2014) - Chicago, IL, USA (2014.9.14-2014.9.18)] 2014 IEEE/RSJ International Conference on Intelligent Robots and Systems - Point cloud registration using congruent pyramids

Krishnan, Aravindhan K, Saripalli, Srikanth

Year:

2014

Language:

english

File:

PDF, 1.13 MB

english, 2014

40

Introduction to the Special Issue on the 50th International Reliability Physics Symposium

Ogawa, Ennis T., Chaparala, Prasad, Stathis, James H., Krishnan, Srikanth

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2013

Language:

english

File:

PDF, 40 KB

english, 2013

41

SPIE Proceedings [SPIE Medical Imaging - San Diego, CA (Saturday 17 February 2007)] Medical Imaging 2007: Visualization and Image-Guided Procedures - Visualizing the process of interaction in a 3D environment

Vaidya, Vivek, Cleary, Kevin R., Miga, Michael I., Suryanarayanan, Srikanth, Krishnan, Kajoli, Mullick, Rakesh

Year:

2007

Language:

english

File:

PDF, 612 KB

english, 2007

42

Left Ventricular Septolateral Mechanical Delay Is Associated with Reduced Long-Term Survival in Systolic Heart Failure with Narrow QRS Duration: Nine-Year Outcome in 109 Patients

Krishnan, Srikanth, Verma, Sanjay, Cheng, Michael, Krishnan, Rajagopal, Pai, Ramdas G.

Journal:

Echocardiography

Year:

2015

Language:

english

File:

PDF, 405 KB

english, 2015

43

A point mutation in AgrC determines cytotoxic or colonizing properties associated with phenotypic variants of ST22 MRSA strains

Mairpady Shambat, Srikanth, Siemens, Nikolai, Monk, Ian R., Mohan, Disha B., Mukundan, Santhosh, Krishnan, Karthickeyan Chella, Prabhakara, Sushma, Snäll, Johanna, Kearns, Angela, Vandenesch, Francois

Journal:

Scientific Reports

Year:

2016

Language:

english

File:

PDF, 2.70 MB

english, 2016

44

[IEEE 2016 IEEE International Reliability Physics Symposium (IRPS) - Pasadena, CA, USA (2016.4.17-2016.4.21)] 2016 IEEE International Reliability Physics Symposium (IRPS) - Optimum filler geometry for suppression of moisture diffusion in molding compounds

Ahn, Woojin, Shin, SangHoon, Asadpour, Reza, Varghese, Dhanoop, Nguyen, Luu, Krishnan, Srikanth, Alam, Muhammad Ashraful

Year:

2016

Language:

english

File:

PDF, 871 KB

english, 2016

45

Time-Dependent Dielectric Breakdown in High-Voltage GaN MIS-HEMTs: The Role of Temperature

Warnock, Shireen, Lemus, Allison, Joh, Jungwoo, Krishnan, Srikanth, Pendharkar, Sameer, del Alamo, Jesus A.

Journal:

IEEE Transactions on Electron Devices

Year:

2017

Language:

english

File:

PDF, 1.21 MB

english, 2017

46

Temporal Pattern and Prognostic Significance of Hypokalemia in Patients Undergoing Targeted Temperature Management Following Cardiac Arrest

Nayeri, Arash, Gluck, Hannah, Farber-Eger, Eric, Krishnan, Srikanth, Shamsa, Kamran, Lee, Michael, Wells, Quinn, McPherson, John

Journal:

The American Journal of Cardiology

Year:

2017

Language:

english

File:

PDF, 869 KB

english, 2017

47

Psychiatric Illness in Takotsubo (Stress) Cardiomyopathy: A Review

Nayeri, Arash, Rafla-Yuan, Eric, Krishnan, Srikanth, Ziaeian, Boback, Cadeiras, Martin, McPherson, John A., Wells, Quinn S.

Journal:

Year:

2018

Language:

english

File:

PDF, 706 KB

english, 2018

48

[IEEE 2017 International Conference on Circuit ,Power and Computing Technologies (ICCPCT) - Kollam, India (2017.4.20-2017.4.21)] 2017 International Conference on Circuit ,Power and Computing Technologies (ICCPCT) - Image denoising based on weighted regularized least square method

Srikanth, M., Krishnan, K. S. Gokul, Sowmya, V., Soman, K. P.

Year:

2017

Language:

english

File:

PDF, 468 KB

english, 2017

49

[IEEE 2018 IEEE International Reliability Physics Symposium (IRPS) - Burlingame, CA (2018.3.11-2018.3.15)] 2018 IEEE International Reliability Physics Symposium (IRPS) - High voltage time-dependent dielectric breakdown in stacked intermetal dielectrics

Shin, SangHoon, Chen, Yen-Pu, Ahn, Woojin, Guo, Honglin, Williams, Byron, West, Jeff, Bonifield, Tom, Varghese, Dhanoop, Krishnan, Srikanth, Alam, Muhammad A.

Year:

2018

Language:

english

File:

PDF, 629 KB

english, 2018

50

HYPOURICEMIC ACTIVITY OF MORINDA CITRIFOLIA (NONI) BY INHIBITION OF XANTHINE OXIDASE FOR TREATMENT OF GOUT

Jeyabalan, Srikanth, Subramanian, Kavimani, Reddy Cheekala, Uma Maheswara, Krishnan, Chitra

Journal:

International Journal of Research in Ayurveda and Pharmacy

Year:

2017

Language:

english

File:

PDF, 882 KB

english, 2017